Concepedia

Ion and neutral yields from ion bombarded metal surfaces during chemisorption using low dose SIMS and multiphoton resonance ionization

Fred M. Kimock, J. P. Baxter, Nicholas Winograd

Surface Science · 1983 · 57 citations · 15 references

DOI

Concepts

References

15

Resonance ionization spectroscopy and one-atom detection

G. S. Hurst, M. G. Payne, Stefan Krämer et al. · Reviews of Modern Physics · 1979 · 528 citations

, , +14

Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)

A. Benninghoven · Surface Science · 1973 · 447 citations

, , +14

Secondary-ion emission probability in sputtering

Jens K. Nørskov, Bengt I. Lundqvist · Physical review. B, Condensed matter · 1979 · 383 citations

, , +13

Multiphoton resonance ionization of sputtered neutrals: a novel approach to materials characterization

Nicholas Winograd, J. P. Baxter, Fred M. Kimock · Chemical Physics Letters · 1982 · 154 citations

, , +15

Oxidation of polycrystalline indium studied by x-ray photoelectron spectroscopy and static secondary ion mass spectroscopy

R. W. Hewitt, Nicholas Winograd · Journal of Applied Physics · 1980 · 136 citations

, , +17