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Frequency characterisation of photodetectors by Fabry-Perot interferometry of modulated semiconductor lasers
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1989
Year
Modulated Semiconductor LasersWideband PhotodetectorsEngineeringOptical Transmission SystemOptical TestingLaser ApplicationsInterferometryFrequency CharacterisationSemiconductor LasersOptical PropertiesInstrumentationPhotonicsFabry-perot InterferometerPhotoelectric MeasurementMillimeter Wave TechnologyMicrowave PhotonicsFabry-perot InterferometryApplied PhysicsSemiconductor LaserOptoelectronics
A new interferometric FM sideband technique based on a Fabry-Perot interferometer is reported for the characterisation of wideband photodetectors. Experiments are carried out with a 1.3µm semiconductor laser modulated at frequencies below 2.5 GHz. Measurements up to 15 GHz are presented for a 7 GHz bandwidth back-illuminated pin photodiode.