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Electrical measurements in high <i>T</i> <i>c</i> Bi-Sr-Ca-Cu-O thin films
32
Citations
7
References
1988
Year
Superconducting MaterialEngineeringThin Film Process TechnologyCritical CurrentsPolycrystalline Thin FilmsSuperconductivityHigh Tc SuperconductorsElectrical MeasurementsThin Film ProcessingLow-temperature SuperconductivityMaterials ScienceElectrical EngineeringHigh-tc SuperconductivityCritical Current DensitySemiconductor MaterialElectrical PropertyHigh-temperature SuperconductivityApplied PhysicsCondensed Matter PhysicsThin FilmsQuantum Superconductivity
Electrical measurements were performed on polycrystalline thin films of the high Tc Bi-Sr-Ca-Cu-O system. The resistance of the superconducting state was confirmed to be smaller than 10−8 Ω cm at 100 K. It is confirmed directly that the critical current density at 77 K was in excess of 105 A/cm2 and the dependence of critical current on temperature was able to be represented approximately by (1−T/Tc )2.
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