Publication | Closed Access
Sensitivity of Extended X-Ray-Absorption Fine Structure to Thermal Expansion
152
Citations
20
References
1999
Year
Materials ScienceX-ray SpectroscopyEngineeringCrystalline DefectsPhysicsNatural SciencesX-ray DiffractionApplied PhysicsQuantum MaterialsCondensed Matter PhysicsLow-temperature Quantum EffectsPhysical ChemistryQuantum ChemistryQuantum EffectsSolid-state PhysicThermal ExpansionX-ray Imaging
The sensitivity of extended x-ray-absorption fine structure (EXAFS) to thermal expansion has been studied by temperature-dependent measurements on germanium. The first cumulant does not reproduce the thermal expansion owing to vibrations normal to the bond. The perpendicular relative displacement $〈\ensuremath{\Delta}{u}_{\ensuremath{\perp}}^{2}〉$ has been for the first time experimentally obtained; the ratio $〈\ensuremath{\Delta}{u}_{\ensuremath{\perp}}^{2}〉/〈\ensuremath{\Delta}{u}_{\ensuremath{\Vert}}^{2}〉$ is in agreement with vibrational model calculations. Low-temperature quantum effects on the 3rd cumulant have been for the first time observed. The possibility of measuring thermal expansion from the 3rd cumulant is demonstrated, provided that quantum effects are taken into account.
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