IEEE Journal of Solid-State Circuits · 2012 · 91 citations · 16 references
EngineeringElectrical EngineeringAnalog ElectronicsInstrumentationMicroelectronicsAnalog InstrumentationAnalog Integrated CircuitsCmos Circuit DesignInstrumentation AmplifiersMixed-signal Integrated Circuit DesignNoise In Analog CircuitsAnalog Readout CircuitsCmos Analog Integrated CircuitsCurrent-feedback Instrumentation AmplifierGain AccuracyInstrumentation AmplificationOffset CompensationOffset CorrectionTransducers
This paper presents a 20-b read-out IC with ±40-mV full-scale range that is intended for use with bridge transducers. It consists of a current-feedback instrumentation amplifier (CFIA) followed by a switched-capacitor incremental ΔΣ ADC. The CFIA's offset and 1/ <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">f</i> noise are mitigated by chopping, while its gain accuracy and gain drift are improved by applying dynamic element matching to its input and feedback transconductors. Their mismatch is reduced by a digitally assisted correction loop, which further reduces the CFIA's gain drift. Finally, bulk-biasing and impedance-balancing techniques are used to reduce the common-mode dependency of these transconductors, which would otherwise limit the achievable gain accuracy. The combination of these techniques enables the read-out IC to achieve 140-dB CMRR, a worst-case gain error of 0.04% over a 0-2.5 V common-mode range, a maximum gain drift of 0.7 ppm/°C and an INL of 5 ppm. After applying nested-chopping, the read-out IC achieves 50-nV offset, 6-nV/°C offset drift, a thermal noise floor of 16.2 nV/√Hz and a 0.1-mHz 1/ <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">f</i> noise corner. Implemented in a 0.7-μm CMOS technology, the prototype read-out IC consumes 270 μA from a 5-V supply.
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Rong Wu, Kofi A. A. Makinwa, Johan H. Huijsing · IEEE Journal of Solid-State Circuits · 2009 · 274 citations · Full text
A Low-Power 22-bit Incremental ADC
V. Quiquempoix, P. Deval, Armando Barreto et al. · IEEE Journal of Solid-State Circuits · 2006 · 143 citations