Atom-chip-based generation of entanglement for quantum metrology - Concepedia

Concepedia

Publication | Open Access

Atom-chip-based generation of entanglement for quantum metrology

DOI Full Paper Access

844

Citations

39

References

2010

Year

Max F. Riedel, Pascal Böhi, Yun Li, Theodor W. Hänsch, Alice Sinatra, Philipp Treutlein

Quantum ScienceEngineeringQuantum ComputingQuantum MetrologyPhysicsNatural SciencesApplied PhysicsQuantum EntanglementQuantum Sensing

References

	Year	Citations

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