High Resolution, High Throughput Electron Tomography Reconstruction

Abstract

To obtain high quality 3D sample data by using electron tomography, there are several aspects of major importance, both on the TEM during the acquisition of data as well as in the subsequent reconstruction process. The acquisition on the Tecnai G 2 TEM microscope is optimized by means of the concepts of (holder) calibration and optimized position and by using an internally consistent set of alignments and calibrations. This paper will show that the only way to achieve high resolution with high throughput (high speed) tomography is to have the processes of reconstruction of the data closely linked to that of acquisition, as is done in our approach using Xplore3D. The fewer image artifacts introduced by optimizing the acquisition, the more accurate and faster the subsequent image alignment and 3D reconstruction can be [1].