Publication | Closed Access
New Technique for the Measurement of Lifetimes of Heavy-Ion Inner-Shell Vacancies
105
Citations
2
References
1974
Year
Materials ScienceIon ImplantationHeavy Ion PhysicEngineeringPhysicsHeavy-ion Inner-shell VacanciesApplied PhysicsAtomic PhysicsShort LifetimesIon Beam InstrumentationIon BeamVacuum DeviceInstrumentationSulfur IonsNew TechniqueIon Emission
We report a new technique for the measurement of short lifetimes (${10}^{\ensuremath{-}14}$ sec) of innershell vacancies in heavy-ion projectiles moving through thin, solid targets. The technique is applicable whenever the yield of projectile x rays does not increase in proportion to target thickness. Lifetime values of 1.5\ifmmode\times\else\texttimes\fi{}${10}^{\ensuremath{-}14}$ and 3.3\ifmmode\times\else\texttimes\fi{}${10}^{\ensuremath{-}14}$ sec have been found for $K\ensuremath{\alpha}$ and $K\ensuremath{\beta}$ transitions, respectively, in highly stripped sulfur ions.
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