Intrinsic dead layer effect and the performance of ferroelectric thin film capacitors

Abstract

We apply the Thomas theory of ferroelectricity to bulk and thin film perovskite ferroelectrics in the paraelectric regime above the transition temperature. From available data on bulk SrTiO3 we are able to fully determine the parameters in the Thomas theory for this material, with overall reasonable results, supporting its validity. In a new application of the Thomas theory to the surface of a thin ferroelectric film in the linear response regime, it is found that there is anticipated to be an intrinsic “dead layer effect” on the surface of a dielectric film which significantly reduces the effective dielectric constant observed in capacitor applications. Two predictions of the theory are verified from recent experimental data. An experiment is suggested to distinguish between linear and nonlinear surface effects.