Publication | Closed Access
The Width of X-Ray Diffraction Lines From Cold-Worked Tungsten and<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>α</mml:mi></mml:math>-Brass
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Citations
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References
1943
Year
X-ray CrystallographyX-ray SpectroscopyEngineeringMechanical EngineeringX-ray Line WidthElectron DiffractionLine WidthMath XmlnsX-ray TechnologyCold-worked TungstenMaterials ScienceMaterials EngineeringAtomic PhysicsSolid MechanicsCrystallographyMicrostructureBragg AngleX-ray DiffractionApplied PhysicsCondensed Matter PhysicsX-ray Diffraction LinesMechanics Of Materials
The x-ray line width from specimens of cold worked $\ensuremath{\alpha}$-brass and tungsten has been measured as a function of Bragg angle and of x-ray wave-length. The results are in agreement with a microstress theory of broadening. In $\ensuremath{\alpha}$-brass the line width is found to depend on crystallographic direction in a systematic manner while with tungsten it does not. Both observations are explained on the basis of the elastic properties of the materials.
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