Influence of Annealing Temperature on Y_2O_3:SiO_2 Nanocomposite Prepared by Sol-Gel Process

Abstract

Oxide nanoparticles embedded in a polymer matrix produce nanocomposites which are useful for optics and electronic applications. Yttrium oxide nanoparticles have received much attention due to their various properties and are signicantly used in fundamental and application oriented elds. The present paper reports the inuence of annealing temperature on the Y2O3:SiO2 nanocomposite prepared by solgel process. Y(NO3)34H2O and tetraethoxysilane were used as precursors and obtained powdered form of Y2O3:SiO2 composite. The powder sample was annealed at 500 C and 900 C for 6 h which were characterized by X-ray diraction, Fourier transform infrared and transmission electron microscope. X-ray diraction data described that the broadening of peaks decreases with increase in annealing temperature which may be due to the increase in particle size. Sample analyzed by Fourier transform infrared and transmission electron microscopy conrmed the grain size dependence on annealing temperature. Cubic phase of yttrium oxide crystal structure was obtained within the silica matrix. The nanocrystallites size has been calculated using DebyeScherrer formula, WilliamsonHall plot and transmission electron micrographs and compared at two dierent temperatures (a) 500 C and (b) 900 C.