Synthesis and characterization of submicron PMMA particles containing rare earth ions on the surface

Abstract

Abstract Emulsifier‐free emulsion polymerization was adopted to synthesize rare earth containing submicron polymer particles under microwave irradiation. To control the size and distribution of the particle, the relationship between reaction time, monomer content, and particle radius was studied for the polymerization of methyl methacrylate (MMA) in the absence and presence of rare earth ions, in which water was used as solvent, and potassium persulfate was used as initiator. In the latter polymerization, the solution of MMA and europium octanoate (EOA) was used instead of MMA itself as EOA can be dissolved in MMA within certain concentrations, and the result shows that the polymerization process is affected by existence of EOA except when the amount of MMA is 2 ml. For particles containing rare earth ions, characterization shows that mole percentage of Eu(III) ion in the surface layer with a thickness of 5 nm, which is estimated from X‐ray photo electron spectroscopy (XPS), is always larger than the value estimated by inductively coupled plasma atomic emission spectrometer (ICP‐AES) for the whole particle, indicating that surface enrichment of rare earth ions took place during the polymerization. Further characterization by XPS depth measurement after Ar + sputtering shows the same result. © 2003 Wiley Periodicals, Inc. J Appl Polym Sci 89: 1124–1131, 2003