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Tunneling and Transport Measurements at the Metal-Insulator Transition of Amorphous Nb: Si
316
Citations
6
References
1983
Year
EngineeringSilicon On InsulatorMetal-insulator TransitionAmorphous NbTunneling MicroscopyCharge Carrier TransportMaterials SciencePhysicsNb ConcentrationSemiconductor MaterialTransport MeasurementsElectrical PropertySolid-state PhysicPrecise ControlApplied PhysicsCondensed Matter PhysicsThin FilmsAmorphous SolidElectrical Insulation
Tunneling and conductivity measurements through the metal-insulator transition in amorphous ${\mathrm{Nb}}_{x}{\mathrm{Si}}_{1\ensuremath{-}x}$ are reported. The authors observe the correlation gap $\ensuremath{\Delta}$ which varies with resistivity and have related this to the metal-insulator transition as observed in the conductivity. The samples were prepared by a process which allows precise control of the Nb concentration. The results as a function of voltage, temperature, and concentration are compared with current theoretical predictions.
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