Effect of the misalignment between the applied and internal magnetic fields on the critical currents of “tilted coated conductors”

Abstract

We present angular-dependent measurements of the critical current density (Jc) of a YBa2Cu3O7 film grown on tilted buffered Ion-Beam-Assisted-Deposition MgO metal tapes. We compare samples with the current parallel and perpendicular to the tape’s direction. In samples with the current parallel to the tape, we observe an asymmetric angular dependence of Jc and a shift of the ab-planes maxima position with the magnetic field strength. The shift is a result of the misalignment between the applied and internal magnetic fields. The misalignment effect takes place at fields lower than 3T at T=75.5K. For samples with the current perpendicular to the tape, we find an overall reduced value of Jc, the angular behavior is symmetrical, and no shift in the maxima position as a function of the magnetic field is observed. These results indicate that the effect of misalignment between the applied and internal magnetic fields must be taken into account when studying the angular dependence of Jc.