Determination of symmetry and molecular arrangements of free-standing liquid crystal films using null-transmission ellipsometry

Abstract

A high resolution null-transmission ellipsometry system has been developed for measurement of the optical properties of liquid crystal free-standing films. The ellipsometric parameters are measured to within a resolution of 0.002° from samples held in a sealed, temperature-controlled environment. By measuring the ellipsometric parameters as a function of applied electric field orientation, the optical symmetry and molecular orientations of free-standing liquid crystal films can be determined in some cases. Three carefully selected applications of this technique are presented.