Discovery of a new type of layered structure by high resolution electron microscopy and electron-induced X-ray microanalysis

Abstract

Combined high resolution electron microscopy, energy dispersive X-ray emission microanalysis, and computer simulation studies indicate that a layered intermediate phase exists in the Bi–Mo–W–O system, its idealized composition being Bi2(W,Mo)12O35; the structure consists of Bi2O3 sheets interleaved with (W,Mo)2O5 sheets which contain crystallographic shear planes that are perpendicular to the layers.