Publication | Closed Access
Images of Interlayer Josephson Vortices in Tl <sub>2</sub> Ba <sub>2</sub> CuO <sub>6+</sub> <sub>δ</sub>
152
Citations
13
References
1998
Year
Superconducting MaterialEngineeringJosephson JunctionsTunneling MicroscopyLayered SuperconductorsNanoelectronicsSuperconductivityQuantum MaterialsHigh Tc SuperconductorsVortex DynamicSuperconducting DevicesMaterials ScienceHigh-tc SuperconductivityPhysicsInterlayer TunnelingInterlayer Josephson TunnelingInterlayer Josephson VorticesApplied PhysicsCondensed Matter PhysicsQuantum Superconductivity
The strength of the interlayer Josephson tunneling in layered superconductors is an essential test of the interlayer tunneling model as a mechanism for superconductivity, as well as a useful phenomenological parameter. A scanning superconducting quantum interference device (SQUID) microscope was used to image interlayer Josephson vortices in Tl2Ba2CuO6+delta and to obtain a direct measure of the interlayer tunneling in a high-transition temperature superconductor with a single copper oxide plane per unit cell. The measured interlayer penetration depth, lambdac, is approximately 20 micrometers, about 20 times the penetration depth required by the interlayer tunneling model.
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