Publication | Open Access
Structural, electrical, photoluminescence and optical properties of n–type conducting, phosphorus-doped ZnO thin films prepared by pulsed laser deposition
25
Citations
48
References
2014
Year
Optical MaterialsEngineeringLuminescent GlassLaser DepositionN–type ConductingOptoelectronic DevicesThin Film Process TechnologySemiconductorsOptical PropertiesBandgap ShiftUv Luminescence PeakPulsed Laser DepositionPhosphoreneCompound SemiconductorMaterials ScienceMaterials EngineeringElectrical EngineeringOxide ElectronicsOptoelectronic MaterialsPzo Thin FilmsApplied PhysicsThin FilmsOptoelectronics
High-quality transparent conductive phosphorus-doped zinc oxide (PZO) thin films were fabricated on glass substrates by pulsed laser deposition (PLD) at different substrate temperatures. X-ray patterns indicated that (0 0 2) preferential growth was observed and P doping did not cause structural degradation of wurtzite ZnO. Hall effect results indicated that 350 °C was the optimum substrate temperature to get PZO thin films with the lowest resistivity (7.35 × 10−4 Ω cm). Photoluminescence spectra showed the UV luminescence peak resulting from the band-edge exciton transition observed for PZO thin films. UV–visible transmission spectra showed that PZO thin films had high transparence (about 85%). In addition, the influence of substrate temperature on bandgap shift in PZO thin films was systematically studied.
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