Evidence for Residual<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>K</mml:mi></mml:math>-Shell Excitation in Chlorine Ions Penetrating Carbon

Abstract

Chlorine ions at 70 and 140 MeV energy impinge upon \ensuremath{\sim}1-\ensuremath{\mu}g/${\mathrm{cm}}^{2}$ Cu targets, in one case after emerging from a carbon prefoil and in the second striking Cu on the back side of a carbon foil. The latter approach leads to an appreciable increase in the Cu $K$ x-ray yield, an effect which is explained in terms of residual Cl $K$-shell excitation and which is in accord with a simple model of competing rearrangement processes.