Concepedia

The determination of lattice parameters and strains in stressed thin films using X-ray diffraction with Seeman-Bohlin focusing

E.L. Haase

Thin Solid Films · 1985 · 43 citations · 8 references

DOI

Concepts

References

8

Intrinsic Stress in Evaporated Metal Films

E. Klokholm, B. S. Berry · Journal of The Electrochemical Society · 1968 · 202 citations

, , +14

Seeman–Bohlin X-ray diffractometer for thin films

B. S. Berry · Journal of Applied Crystallography · 1970 · 123 citations

, , +16

Residual strains of Pb thin films deposited onto Si substrates

Masanori Murakami · Acta Metallurgica · 1978 · 76 citations

, , +16

Mechanical properties of optical films

H.K. Pulker · Thin Solid Films · 1982 · 74 citations

, , +14

The phase diagram of the niobium-germanium system

J.L. Jordá, R. Flükiger, Jean‐Pierre Müller · Journal of the Less Common Metals · 1978 · 69 citations

, , +14