Publication | Closed Access
Overabundant single-particle electron microscope views induce a three-dimensional reconstruction artifact
40
Citations
14
References
1998
Year
EngineeringElectron MicroscopyPhysicsMicroscopyMicroscopy MethodApplied PhysicsThree-dimensional Reconstruction ArtifactElectron DiffractionElectron MicroscopeComputational ImagingElectron Optic
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