A comparative study of charge transfer inefficiency value and trap parameter determination techniques making use of an irradiated ESA-Euclid prototype CCD

Abstract

The science objectives of space missions using CCDs to carry out accurate astronomical measurements are put at risk by the radiation-induced increase in charge transfer inefficiency (CTI) that results from trapping sites in the CCD silicon lattice. A variety of techniques are used to obtain CTI values and derive trap parameters, however they often differ in results. To identify and understand these differences, we take advantage of an on-going comprehensive characterisation of an irradiated Euclid prototype CCD including the following techniques: X-ray, trap pumping, flat field extended pixel edge response and first pixel response. We proceed to a comparative analysis of the obtained results.