Interdependence of elastic strain and segregation in metallic multilayers: An x-ray diffraction study of (111) Au/Ni multilayers

Abstract

This study concerns the analysis of elastic strains in Au/Ni multilayers whose periods lie in the range 1–5 nm. Lattice parameter measurements have been performed by x-ray diffraction in various directions. The results are interpreted in terms of elastic strain and interfacial mixing. It is shown that considerable strains (several percent) are encountered within these very thin layers. In the Au sublayers, coherence is never observed with the underlying Ni film and the residual strain relaxes progressively as the Au film thickens. In the Ni sublayers, interfacial mixing controls the lattice parameter and the elastic strain is a function of this mixing. Out of equilibrium mixing of Au into Ni is ascribed to dynamic segregation during the growth of Ni on Au. All these results bring new insights on the still open question of stress relaxation mechanisms in ultrathin films.