Studies on Si(111) 7/8 × 7/8 -Bi and -Ag surfaces by x-ray diffraction under nearly normal incidence

Abstract

X-ray intensity versus energy (I-E) curves were measured in order to obtain the rod profiles. The three-dimensional surface structures of Si(111) 7/8 × 7/8 -Bi and -Ag were analyzed. The adsorption sites with respect to the crystal were derived from the intensity changes along the integral-order rods especially near the Bragg points by utilizing the interference effect between the x rays diffracted from the adsorbed layer and the bulk crystal. The positions of the surface Si atoms were studied by using the interference effect between the x rays diffracted from the adsorbed layer and the surface Si layer.