Publication | Closed Access
Structural and electrical charaterization of crystallographic defects in silicon ribbons
74
Citations
16
References
1980
Year
Electrical EngineeringEngineeringPhysicsCrystalline DefectsApplied PhysicsSiliceneDefect FormationSilicon On InsulatorDefect ToleranceCrystallographyElectrical CharaterizationSilicon Debugging
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