Microstructural Characterization of Galvanneal Coatings by Transmission Electron Microscopy.

C. S. Lin, M. Meshii, C. C. Cheng

ISIJ International · 1995 · 24 citations · 0 references

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Abstract

A technique has beendeveloped so that a number of cross sections of galvanneal coatings can be examined efficiently and reproducibly by transmission electron microscopy, and applied to study the microstructures of a series of simulator-made galvanneal coatings on interstitial-free