A simple free-space method for measuring the complex permittivity of single and compound dielectric materials

Abstract

A simple and efficient method for determining the complex permittivity of dielectric materials from both reflected and transmitted signals is presented. It is also novel because the technique is implemented using two pyramidal horns without any focusing mechanisms. The dielectric constant of a noninteractive and distributive (NID) mixture of dielectrics is also determined. © 2000 John Wiley & Sons, Inc. Microwave Opt Technol Lett 26: 117–119, 2000.