Publication | Closed Access
Temperature characteristics of positron trapping at defects in electron-irradiated silicon
20
Citations
17
References
1989
Year
Positron TrappingEngineeringPhysicsPositron Annihilation SpectroscopyApplied PhysicsDefect FormationSilicon On InsulatorDefect ToleranceSilicon Debugging
| Year | Citations | |
|---|---|---|
Page 1
Page 1