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Molecular-beam-epitaxial growth and optical analysis of InAs/AlSb strained-layer superlattices
26
Citations
24
References
1993
Year
Materials ScienceIi-vi SemiconductorOptical MaterialsEngineeringPhysicsOptical PropertiesInterface BondApplied PhysicsPhononInas/alsb Strained-layer SuperlatticesOptic PhononsSls StructureMolecular Beam EpitaxyEpitaxial GrowthOptoelectronicsSemiconductor Nanostructures
Structural and optical properties of InAs/AlSb strained-layer superlattices (SLSs) grown by molecular-beam epitaxy (MBE) are described. Either an interface bond of InSb or AlAs was selectively made in the SLSs by controlling the beam supply sequence during growth. Characterization of the SLSs was performed using Raman scattering and photoluminescence (PL) spectroscopy in addition to the in situ analysis of reflection high-energy electron-diffraction signals. The Raman signals consisted of three different types of lattice vibrations: InSb- or AlAs-like phonons localized at the interface bonds, InAs- and AlSb-like optic phonons confined in the respective layers, and zone-folded acoustic phonons extending through the constituent layers. The energy shift of the optic phonons was used to determine the strain in SLSs. This analysis revealed a considerable dependence of the SLS structure on the interface bond. The Raman analysis was also supported by the PL data. These optical properties are discussed in relation to the MBE-growth conditions of SLSs.
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