A Novel Method for Testing Integrated RF Substrates

Abstract

This paper discusses a novel and a low cost testing technique for integrated radio frequency (RF) substrates with embedded passive filters. This technique is based on resonator and regression analyses and uses low-frequency measurements to predict the filter's insertion loss at high frequency. Moreover, only one-port (Sll) measurement is required for this two-port parameter prediction. Hence; this novel testing technique reduces the cost of test equipments and testing time. To show the feasibility of this proposed methodology both simulation and hardware results are presented for embedded diplexer. The results show that by our proposed methodology, testing frequency can be reduced by approximately 47% for low-pass filter and 33% for high-pass filter of the design frequency.