Journal of The Electrochemical Society · 2009 · 34 citations · 20 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsNanoelectronicsNanowiresOptoelectronic MaterialsPhotodetectorsSemiconductor Device MaterialsSemiconductor NanomaterialsContrast RatioMolecular Beam EpitaxyNanowire PhotodetectorsPhotodetectionSemiconductor NanowiresShadow Mask PatterningSiliconUltraviolet Photodetectors
We reported the growth of ZnSe nanowires on oxidized Si substrate by molecular-beam epitaxy. It was found that average length, average diameter, and density of the ZnSe nanowires were , , and , respectively. It was also found that the ZnSe nanowires were structurally uniform and defect-free with a pure zinc blend structure. UV photodetectors were then fabricated by sputtering a thick Au film through an interdigitated shadow mask onto the ZnSe nanowires. It was found that photocurrent to dark current contrast ratio of our ZnSe nanowire photodetector was with applied bias.
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Temperature dependence of the energy gap in semiconductors
Y. P. Varshni · Physica · 1967 · 5.3K citations
Growth of nanowire superlattice structures for nanoscale photonics and electronics
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