Sub-Ångstrom high-resolution transmission electron microscopy at 300keV - Concepedia

Concepedia

Publication | Closed Access

Sub-Ångstrom high-resolution transmission electron microscopy at 300keV

116

Citations

28

References

2001

Year

M. A. O’Keefe, Crispin Hetherington, Yi‐Ching Wang, E. Chris Nelson, J. Harvey Turner, Christian Kisielowski, J.‐O. Malm, Rolf Mueller, J. Ringnalda, Mingming Pan,

Ultramicroscopy

Electron MicroscopyMicroscopyApplied PhysicsElectron MicroscopeInstrumentation

References

	Year	Citations

Page 1