Concepedia

Precision Ion Polishing System -A New Instrument for TEM Specimen Preparation of Materials

R. Alani, P. R. Swann

MRS Proceedings · 1991 · 25 citations · 1 references

DOI

Concepts

References

1

Chemically Assisted Ion Beam Etching (CAIBE)- a New Technique for TEM Specimen Preparation of Materials

R. Alani, Joseph S. Jones, P. R. Swann · MRS Proceedings · 1990 · 24 citations

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