Determination of Trapping Parameters from TSC in Polyethylene

Abstract

The trapping parameters of one of the carrier traps in low-density polyethylene were evaluated by using the X-ray-induced thermally-stimulated current (TSC) technique. The values obtained were E t (trap depth): 0.90 eV, µτ (product of mobility and lifetime): 5×10 -13 m 2 /V and n to (initial density of trapped carriers): 2.9×10 20 m -3 . Assuming the fast retrapping case, N t (trap density) was 1.4×10 21 m -3 and, assuming the slow retrapping case, S t (capture cross-section) and ν (attempt-to-escape frequency) were 1.1×10 -17 m 2 and 3×10 13 sec -1 , respectively. Whether the retrapping was fast or slow, was not determined from the TSC results only.