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<i>In</i> <i>situ</i> synchrotron studies of the structural properties of Y-Ba-Cu-O thin films during growth
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1991
Year
EngineeringThin Film Process TechnologySuperconductivityPulsed Laser DepositionEpitaxial GrowthThin Film ProcessingMaterials ScienceStructural PropertiesPhysicsOxide ElectronicsMultiple AxesY-ba-cu-o Thin FilmsFirst Real TimeMaterial AnalysisFaced-magnetron Sputtering SystemSurface ScienceApplied PhysicsCondensed Matter PhysicsThin Films
We report the first real time, in situ synchrotron x-ray studies of Y-Ba-Cu-O thin-film growth on (100) SrTiO3 using a miniature, faced-magnetron sputtering system. A combination of the substrate temperature and the deposition rate determines whether the film grows along the a, c, or multiple axes.
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