A Quantitative Study of PCBM Diffusion during Annealing of P3HT:PCBM Blend Films

Abstract

Scanning transmission X-ray microscopy has been used to quantitatively map the composition of P3HT:PCBM blend films in the vicinity of PCBM crystals formed during annealing at 140 °C. The observed PCBM concentration profiles around these crystals have been fitted to Fick’s second law of diffusion and the diffusion constant found to be 2.5 × 10−14 m2 s−1. The PCBM concentration at the crystal boundary was found to be 19% (v/v) and is interpreted, together with the annealing temperature of 140 °C, as a point on the bimodal line of the composition−temperature phase diagram. The diffusion of PCBM through P3HT is observed to be bulk-dominated, in contrast to the surface/interface-dominated diffusion observed in MDMO-PPV:PCBM blend films by Yang et al.(1, 2)