Wavelet based methods on patterned fabric defect detection

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Spectral Theory, Multiresolution Representations, Image Analysis +12

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R.T. Chin, Charles A. Harlow · IEEE Transactions on Pattern Analysis and Machine Intelligence · 1982 · 396 citations

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Fabric defect detection by Fourier analysis

Chi-Ho Chan, G.K.H. Pang · 2003 · 332 citations

Geometric Modeling, Textile Engineering, Machine Vision +13