Physical Review Letters · 1985 · 156 citations · 12 references
EngineeringMaterials EngineeringMaterials ScienceCondensed Matter PhysicsElectronic MaterialsSemiconductor MaterialsCarrier TransportDiffusion In SolidsDopingSemiconductor DefectsSemiconductor PhysicsSilicon MaterialsDefect DiffusionDiffusion MechanismsDopant DefectsDopant DiffusionImpurity DiffusionMicroscopic CalculationsSelf-interstitialsSubstitutional Defects
We present the first microscopic calculations of the energetics of impurity-defect reactions and provide a detailed picture of the diffusion mechanisms of dopant impurities in Si. We find that vacancies mediate impurity diffusion via impurity-vacancy pairs. Self-interstitials mediate diffusion by ejecting substitutional impurities into interstitial channels and/or via impurity-self-interstitial pairs. The predicted activation energies for P and Al agree well with measured values in both intrinsic and extrinsic Si.
12
G. D. Watkins, J. W. Corbett · Physical Review · 1964 · 729 citations
RADIATION DAMAGE IN SEMICONDUCTORS.
P. Baruch · Defense Technical Information Center (DTIC) · 1963 · 564 citations
Microscopic Theory of Atomic Diffusion Mechanisms in Silicon
Roberto Car, Paul J. Kelly, Atsushi Oshiyama et al. · Physical Review Letters · 1984 · 331 citations