A novel technique for high impedance fault identification

Abstract

A novel technique using wavelet analysis filter banks (WAFB) to identify distribution high impedance faults (HIFs) is presented. A new model of HIF is used. HIFs and capacitor bank switching operations are simulated by the Electromagnetic Transients Program (EMTP) and their current signals are studied. High frequency components with the time localization information of both HIFs and capacitor bank switching operations are obtained using WAFB and their behavior is differentiated clearly. Results demonstrate that WAFB can be used as an element in a HIF detector for fast and accurate identification of distribution HIFs.