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The Diffusion of Bismuth in Silicon

11

Citations

9

References

1989

Year

Abstract

The diffusion of bismuth into silicon from a spin-on source has been investigated at a temperature range of 1050–1200°C. The concentration profile of bismuth agrees with the complementary error function, and its diffusion coefficient shows a value similar to the values of phosphorus and boron. Its activation energy is estimated to be 2.50 eV. That is much smaller than the values of phosphorus, boron and arsenic.

References

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