Publication | Closed Access
Stacking fault densities in the copper-germanium, copper-silicon and copper-germanium silicon alloys
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Citations
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References
1963
Year
Materials ScienceMaterials EngineeringEngineeringPhysicsApplied PhysicsCondensed Matter PhysicsDefect FormationSemiconductor Device FabricationDefect ToleranceFault DensitiesCopper-germanium Silicon AlloysMicrostructureSilicon DebuggingMicroelectronics
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