Quantitative measurement and design of texture morphology for high-efficiency thin-film silicon solar cells

Abstract

To decouple the trade-off relationship between short-circuit current ISC and open-circuit voltage VOC of thin-film silicon solar cells, which vary with texture morphology, it is necessary to first clarify the relationship between a solar cell's properties and its texture morphology. We have developed a method for quantitatively measuring the texture morphology, which has enabled us to identify novel indices on the basis of texture width and angle individually correlated to ISC and VOC. A texturing process based on these indices should allow ISC and VOC to be improved independently.