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X-ray reflectivity studies on DLC films deposited by microwave ECR CVD: Effect of substrate bias

DOI

10

Citations

21

References

2008

Year

S.B. Singh, A.K. Poswal, M. Pandey, R.B. Tokas, Navin Chand, Sandip Dhara, B. Sundaravel, K.G.M. Nair, N. K. Sahoo, D.S. Patil
Surface and Coatings Technology

References

YearCitations

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