XPS characterization of surface fluorinated poly(4‐methyl‐1‐pentene)

Abstract

Abstract The fluorinated surface layer of poly(4‐methyl‐1‐pentene) membranes exposed to a dilute stream of fluorine gas has been characterized with X‐ray photoelectron spectroscopy. The concentration and profile of reacted fluorine as a function of exposure time is determined. A computer routine was employed to deconvolute the poorly resolved carbon spectra after various fluorine exposure times. The concentrations of mono‐, di‐, and trifluorocarbon groups thus determined were used to propose specific structures of PMP at the surface after 1 and 15 min of fluorination. The carbon spectra collected at electron takeoff angles of 15°, 30°, and 90° were also deconvoluted, giving insight into the placement of fluorine as a function of depth. Oxygen is incorporated into the polymer during the fluorination reaction, and the O1s spectra was deconvoluted to determine how the oxygen is bound.