Publication | Open Access
1.3 μm InAs/GaAs quantum‐dot laser monolithically grown on Si substrates operating over 100°C
85
Citations
14
References
2014
Year
EngineeringLaser ApplicationsLaser MaterialOptoelectronic DevicesHigh-power LasersSemiconductor NanostructuresSemiconductorsSemiconductor LasersInalas/gaas Strained‐layer SuperlatticeCompound SemiconductorSemiconductor TechnologyPhotonicsSi SubstratesQuantum DeviceSemiconductor Device FabricationμM Inas/gaas Quantum‐dotApplied PhysicsDislocation Filter LayersOptoelectronics
A high‐performance 1.3 μm InAs/GaAs quantum‐dot laser directly grown on Si substrates has been achieved by using InAlAs/GaAs strained‐layer superlattice serving as dislocation filter layers (DFLs). The Si‐based laser achieves lasing operation up to 111°C with a threshold current density of 200 A/cm 2 and an output power exceeding 100 mW at room temperature.
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