Raman and XPS studies of CIGS/Mo interfaces under various annealing temperatures - Concepedia

Concepedia

Publication | Closed Access

Raman and XPS studies of CIGS/Mo interfaces under various annealing temperatures

25

Citations

16

References

2014

Year

Junfeng Han, Liangqi Ouyang, Daming Zhuang, Cheng Liao, Jiang Liu, Ming Zhao, Limei Cha, Marie‐Paule Besland

Materials Letters

Materials ScienceIi-vi SemiconductorEngineeringOxide ElectronicsApplied PhysicsCigs/mo InterfacesSemiconductor MaterialXps Studies

References

	Year	Citations

Page 1