Publication | Closed Access
An analytic model to estimate the avalanche breakdown voltage improvement for LDD devices
11
Citations
8
References
1985
Year
Electrical EngineeringEngineeringPower DeviceTime-dependent Dielectric BreakdownCircuit ReliabilityAnalytic ModelLdd DevicesPower ElectronicsMicroelectronics
| Year | Citations | |
|---|---|---|
Page 1
Page 1