Sensitive 320 Gbit/s eye diagram measurements via optical sampling with semiconductor optical amplifier-ultrafast nonlinear interferometer

Inuk Kang, K.F. Dreyer

Electronics Letters · 2003 · 29 citations · 5 references

Concepts

Abstract

High bit rate (320 Gbit/s) all-optical eye measurements requiring only milliwatt signal power and 25 fJ sampling pulse energy are reported. The system is based on a semiconductor optical amplifier interferometer with time-domain filtering of the ASE noise.

References

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