Electronics Letters · 2013 · 28 citations · 7 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsOptoelectronicsSemiconductor DevicesHigh-frequency Semiconductor DevicesOptical DetectorsPhotodetectorsQuantum Well DevicesQuantum WellsSemiconductor DetectorsHeterostructure PhotodetectorsPhotodiode CircuitsPhotodiodesQuantum Well HeterostructuresQuantum Well PhotodetectorsQuantum Well StructuresStrained Quantum Wells
An edge‐coupled high‐speed photodiode based on strained InGaAs quantum wells for detection at 2000nm is demonstrated. The fabricated device shows a leakage current as low as 120nA at −3V bias voltage and a responsivity of around 0.3A/W at 2000nm. The high‐speed butterfly packaging of the device is presented which shows a 3dB bandwidth of more than 10GHz. The device shows similar high‐speed performance at 1550nm.
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