Registration of 16 Sorghum Germplasm Lines

Abstract

The sorghum [ Sorghum bicolor (L.) Moench] germplasm lines Tx2945 through Tx2952 and Tx2954 through Tx2961 (Reg. No. GP‐645 to GP‐660, PI 655260 to PI 655275) were developed and released by Texas AgriLife Research (formerly the Texas Agricultural Experiment Station), Lubbock, TX, in 2006. These lines are 3‐dwarf (dw 1 Dw 2 dw 3 dw 4 ) in height and possess unique combinations of tan plant color, agronomic traits, traits for resistance to head smut [ Sphacelotheca reiliana (Kuhn) Clinton], rust [ Puccinia purpurea (Cooke)], zonate leaf spot ( Gloeocercospora sorghi Bain and Edgerton), bacterial leaf streak [ Xanthomonas holcicola (Elliot) Starr and Burkholder], and bacterial leaf stripe [ Pseudomonas andropogoni (E.F. Smith) Stapp], and biotype E greenbug [ Schizaphis graminum (Rondani)] resistance.